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The Epsilon 1 is a fully integrated energy dispersive XRF analyzer consisting of a spectrometer, built-in computer, touch screen and analysis software. Powered by the latest advances …
The Epsilon 1 is a fully integrated energy dispersive XRF analyzer consisting of a spectrometer, built-in computer, touch screen and analysis software. Powered by the latest advances …
Do you need elemental analysis of small objects or small inclusions in electronic appliances, toys, jewelry, rocks or finished products? Epsilon 1 for small spot analysis, a compact X-ray fluorescence spectrometer, is the ideal analytical solution…
Do you need elemental analysis of small objects or small inclusions in electronic appliances, toys, jewelry, rocks or finished products? Epsilon 1 for small spot analysis, a compact X-ray fluorescence spectrometer, is the ideal analytical solution for a flexible and precise spot-on analysis.
The measuring procedure is easy and straightforward: Place any shaped sample directly in the spectrometer without the need of sample preparation. Position the requested detail above the small measuring spot with the help of a color camera, initiate the measurement and receive your results.
Due to the self-contained design and small footprint, Epsilon 1 can be placed close to the sample location, making the instrument an ideal solution for any elemental analysis in production facilities, exploration sites, at the shop counter or even at crime sites for forensic investigation.
Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the PANal…
Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the PANalytical Axios FAST simultaneous WDXRF spectrometer is the ideal solution. Accurate and robust analysis, ease of operation by less-experienced staff and high uptime go hand in hand with a low cost of ownership.
X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium spectrometer…
X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium spectrometer leads the market in high-quality design and innovative features for sub ppm to percentage analysis of Be to Am.
The next generation cost-effective, multipurpose X-ray diffraction platform
X’Pert³ Powder is PANalytical’s newest X-ray diffraction system based on the fully renewed X’Pert platform. With new on-board control electronics, compliance…
The next generation cost-effective, multipurpose X-ray diffraction platform
X’Pert³ Powder is PANalytical’s newest X-ray diffraction system based on the fully renewed X’Pert platform. With new on-board control electronics, compliance with the latest and most stringent X-ray and motion safety norms, advances in eco-friendliness and reliability the X’Pert³ Powder is ready for the future.
The new generation of versatile materials research diffraction systems
The long and successful history of PANalytical’s Materials Research Diffractometers (MRD) continues with a new generation – X’Pert³ MRD and X’Pert³ MRD XL.Both systems handle the same wide range of applications with full wafer mapping up to 100 mm (X’Pert³ MRD) or 200 mm (X’Pert³ MRD XL).
DKSH is the exclusive distributor in Cambodia, Laos, Malaysia, Myanmar, Philippines, Thailand and Vietnam.
Increase your process efficiency and recovery rate X-ray fluorescence spectroscopy (XRF) has an important and well-established analytical role within the mining and minerals industry. It is used extensively for exploration, grade control, process …
Increase your process efficiency and recovery rate X-ray fluorescence spectroscopy (XRF) has an important and well-established analytical role within the mining and minerals industry. It is used extensively for exploration, grade control, process monitoring and assuring that the composition of waste is within the limits of environmental norms and regulations.
Epsilon 4 benchtop spectrometers are used in mining operations, even at remote locations, for fast elemental analysis of ores, minerals and rocks. The combination of low infrastructural demands and the high analytical performance, enables quick determination of operation strategies in mining locations where utilities are limited.
Discover the possibilities of XRF analysis and reduce your feedback time from hours to minutes by placing the benchtop XRF spectrometer next to your mine or processing plant.
Meet Aeris – our brand-new X-ray benchtop diffractometer. Aeris will impress you with data quality and speed of data acquisition so far only seen on full-power systems. The instrument is accessible for everyone with its built-in touch screen and…
Meet Aeris – our brand-new X-ray benchtop diffractometer. Aeris will impress you with data quality and speed of data acquisition so far only seen on full-power systems. The instrument is accessible for everyone with its built-in touch screen and intuitive software.
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