Portable X-ray diffractometer specially designed for residual stress and retained austenite measurements Xstress 3000 G3 is suitable for both laboratory and field use. It can be easily loaded, unloaded and carried by one person. It is self-contained and only requires a power supply. From the point at which it is unloaded to the moment it is ready to perform a measurement takes only ten minutes. Extensive use of embedded microprocessors, and communications between the main unit, goniometer, and computer with only one cable makes fast installation possible. Thanks to the implementation of the state of the art, patented, semiconductor detector technology, the measurement time on a typical steel sample is two minutes or less.